DDP-Fsim: Efficient and Scalable Fault Simulation for Deterministic Patterns with Two-Dimensional Parallelism. - Feng Gu; Mingjun Wang; Jianan Mu; Zizhen Liu; Jiaping Tang; Hui Wang 152; Yonghao Wang; Jing Ye 001; Huawei Li 001; Xiaowei Li 001 (ICCAD, 2024)

Efficient Functional Safety Method for Gate-Level Fine-Grained Digital Circuits with ISO-26262. - Mingjun Wang; Hui Wang 152; Jianan Mu; Zizhen Liu; Jun Gao; Jing Ye 001; Huawei Li 001; Xiaowei Li 001 (ITC-Asia, 2024)

ETPG: Efficient Transition Fault Simulation via Dual-Strategy Pattern Parallelism and Gate Restructuring. - Mingjun Wang; Hui Wang 152; Zizhen Liu; Feng Gu; Jianan Mu; Jiaping Tang; Jun Gao; Huawei Li 001; Jing Ye 001; Xiaowei Li 001 (ASP-DAC, 2025)