Electrical and Physical Characteristics of WO3/Ag/WO3 Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †. - Shea-Jue Wang; Mu-Chun Wang; Shih-Fan Chen; Yu-Hsiang Li; Tien-Szu Shen; Hui-Yun Bor; Chao-Nan Wei (Sensors, 2018)

Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments. - De-Cheng Zhang; Ching-Chuan Chou; Ho-Hsiang Chen; Shang-Ze Chen; Jian-Ming Chen; Hui-Yun Bor; Wen-How Lan; Mu-Chun Wang (ICKII, 2020)