Dynamic multi-parameter response model for SEED analysis. - Mart Coenen; Ming Ye; Huichun Yu (EMC Compo, 2015)

EMI common-mode (CM) noise suppression from self-calibration of high-speed SST driver using on-chip process monitoring circuit. - Khawaja Qasim Maqbool; Duona Luo; Guang Zhu; Xingyun Luo; Huichun Yu; C. Patrick Yue (ISCAS, 2017)

EMI-Related Common-Mode (CM) Noise Analysis and Prediction of High-Speed Source-Series Terminated (SST) I/O Driver in System-on-Package (SOP). - Khawaja Qasim Maqbool; Duona Luo; Xingyun Luo; Huichun Yu; C. Patrick Yue (IEEE Trans. Circuits Syst. II Express Briefs, 2018)