Defect Identification of Adhesive Structure Based on DCGAN and YOLOv5. - Yong Jin 004; Huifang Gao; Xiaoliang Fan; Hassan Khan; Youxing Chen (IEEE Access, 2022)

Bonding Defect Detection Based on Improved Single Shot MultiBox Detector. - Huifang Gao; Yong Jin 004; Maozhen Li 001; Youxing Chen; Junbin Zang; Xiaoliang Fan (Comput. Informatics, 2024)