Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design. - Huifei Rao; Jie Chen 002; Changhong Yu; Woon Tiong Ang; I-Chyn Wey; An-Yeu Wu; Hong Zhao (ISCAS, 2007)

An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on belief propagation. - Huifei Rao; Jie Chen 002; Vicky H. Zhao; Woon Tiong Ang; I-Chyn Wey; An-Yeu Wu (ISCAS, 2008)