SAT-based Formal Fault-Resistance Verification of Cryptographic Circuits. - Huiyu Tan; Pengfei Gao; Taolue Chen 001; Fu Song; Zhilin Wu (CoRR, 2023)

Compositional Verification of Cryptographic Circuits Against Fault Injection Attacks. - Huiyu Tan; Xi Yang; Fu Song; Taolue Chen 001; Zhilin Wu (FM (2), 2024)

Study on the Effect of H2 on SF6 Degradation and its Product Distribution in Tandem DBD. - Ying Zhang; Mingwei Wang; Yalong Li 002; Lei Yu; Huiyu Tan; Kun Wan 002; Zhaodi Yang; Zhe Huang; Xiang Li; Yin Zhang (IEEE Access, 2024)

SAT-based Formal Verification of Fault Injection Countermeasures for Cryptographic Circuits. - Huiyu Tan; Pengfei Gao; Fu Song; Taolue Chen 001; Zhilin Wu (IACR Trans. Cryptogr. Hardw. Embed. Syst., 2024)