Automatic Yield Management System for Semiconductor Production Test. - Huiyuan Cheng; Melanie Po-Leen Ooi; Ye Chow Kuang; Eric Kwang Joo Sim; Bryan Cheah; Serge N. Demidenko (DELTA, 2011)

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. - Melanie Po-Leen Ooi; Hong Kuan Sok; Ye Chow Kuang; Huiyuan Cheng; Eric Kwang Joo Sim; Serge N. Demidenko; Chris W. K. Chan (IEEE Des. Test, 2013)