Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. - Hung V. Pham; Serge N. Demidenko; Giovanni M. Merola (I2MTC, 2017)

High-Performance Stacked Ensemble Model for Stride Length Estimation with Potential Application in Indoor Positioning Systems. - Hang T. Duong; Kha M. Hoang; Hung V. Pham; Vu A. Trinh (J. Commun., 2022)

An Integrated Learning Approach for Municipal Solid Waste Classification. - Hieu M. Tran; Minh Tuan Le; Hung V. Pham; Minh T. Vu; Son Vu Truong Dao (IEEE Access, 2024)

An Internet-of-Things-Integrated Deep Learning Model for Fault Diagnosis in Industrial Rotating Machines. - Minh Tuan Le; Hieu M. Tran; Ke Wang 007; Hung V. Pham; Son Vu Truong Dao (IEEE Access, 2025)