Self-testing and self-reconfiguration architecture for 2-D WSI arrays. - Hussam Y. Abujbara; Sami A. Al-Arian (SPDP, 1990)

A Unique Approach to Built-in-Self-Test Circuit Design. - Sami A. Al-Arian; Hussam Y. Abujbara; Jim C. Ruel (ICCD, 1991)

Degrading fault model for WSI interconnection lines. - Hussam Y. Abujbara; Sami A. Al-Arian (VTS, 1993)