OPTIMUS: a new program for OPTIMizing linear circuits with number-splitting and shift-and-add decompositions. - Huy Nguyen 001; Abhijit Chatterjee (ARVLSI, 1995)

Impact of Partial Reset on Fault Independent Testing and BIST. - Huy Nguyen 001; Abhijit Chatterjee; Rabindra K. Roy (VLSI Design, 1997)

Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits. - Huy Nguyen 001; Rabindra K. Roy; Abhijit Chatterjee (VLSI Design, 1998)

Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits. - Huy Nguyen 001; Rabindra K. Roy; Abhijit Chatterjee (J. Electron. Test., 1999)

Design of Real-Number Checksum Codes Using Shared Partial Computation for CED in Linear DSP Systems. - Huy Nguyen 001; Abhijit Chatterjee (IOLTW, 2002)