New Burnout Failure at the Chip Edge: Analysis and Preventive Design by a Novel Experimental Approach. - Seungmin Lee; Taegon Lee; Gaeun Kim; Kwang-Ryul Lee; Eunji An; Sekwon Hong; Sungjun Kim; Soonkwan Kang; Seokwoo Hong; Hwan Cha; Minkyu Kang; Jaesun Yun; et al. (IRPS, 2025)