Reliability on EUV Interconnect Technology for 7nm and beyond. - Tae-Young Jeong; Miji Lee; Yunkyung Jo; Jinwoo Kim; Min Kim; Myungsoo Yeo; Jinseok Kim 005; Hyunjun Choi; Joosung Kim; Yoojin Jo; Yongsung Ji; Taiki Uemura; et al. (IRPS, 2020)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. - Hai Jiang 005; Hyun-Chul Sagong; Jinju Kim; Hyewon Shim; Yoohwan Kim; Junekyun Park; Taiki Uemura; Yongsung Ji; Taeyoung Jeong; Dongkyun Kwon; Hwasung Rhee; Sangwoo Pae; et al. (IRPS, 2020)

Trap Density Modulation for IO FinFET NBTI Improvement. - Rakesh Ranjan; Charles B. LaRow; Ki-Don Lee; Minhyo Kang; Pavitra R. Perepa; Md. Shahriar Rahman; Bong Ki Lee; David Moreau; Carolyn Cariss-Daniels; Timothy Basford; Colby Callahan; Maihan Nguyen; et al. (IRPS, 2020)

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; Euncheol Lee; Jaehee Choi; et al. (IRPS, 2020)

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Youngin Park; Kiil Hong; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; et al. (IRPS, 2020)

Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. - Hai Jiang 005; Jinju Kim; Kihyun Choi; Hyewon Shim; Hyunchul Sagong; Junekyun Park; Hwasung Rhee; Euncheol Lee (IRPS, 2021)

Chip to Package Interaction Risk Assessment of FCBGA Devices using FEA Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique. - Moon Soo Lee; Inhak Baick; Min Kim; Seo Hyun Kwon; Myeong Soo Yeo; Hwasung Rhee; Euncheol Lee (IRPS, 2021)

Systematic Study of Process Impact on FinFET Reliability. - Rakesh Ranjan; Ki-Don Lee; Md Iqbal Mahmud; Mohammad Shahriar Rahman; Pavitra Ramadevi Perepa; Charles Briscoe LaRow; Caleb Dongkyun Kwon; Maihan Nguyen; Minhyo Kang; Ashish Kumar Jha 005; Ahmed Shariq; Shamas Musthafa Ummer; et al. (IRPS, 2021)

Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Mijoung Kim; Dalhee Lee; Gunrae Kim; Seungbae Lee; Taesjoong Song; Hwasung Rhee; Brandon Lee; Jaehee Choi (IRPS, 2021)

Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. - SungMan Rhee; Hyunjin Kim; Sangku Park; Taiki Uemura; Yuchul Hwang; Seungjin Choo; Jinju Kim; Hwasung Rhee; Shin-Young Chung (IRPS, 2023)