A Defect Inspection Method for Machine Vision Using Defect Probability Image with Deep Convolutional Neural Network. - Chanhee Jang; Sang-Yun Yun; Hyejin Hwang; Hyunmin Shin; SeongSoo Kim; YangSub Park (ACCV (1), 2018)

A Voltage and Temperature Tracking SRAM Assist Supporting 740mV Dual-Rail Offset for Low-Power and High-Performance Applications in 7nm EUV FinFET Technology. - Inhak Lee; Hanwool Jeong; Sangyeop Baeck; Siddharth Gupta 008; Changnam Park; Dongwook Seo; Jaeseung Choi 001; Jaeyoung Kim; Hoon Kim; Jungmyung Kang; Sunyung Jang; Daeyoung Moon; et al. (ISSCC, 2019)

Self-supervised Medical Out-of-Distribution Using U-Net Vision Transformers. - Seongjin Park; Adam Balint; Hyejin Hwang (MIDOG/MOOD/Learn2Reg@MICCAI, 2021)