Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. - Sungyoul Seo; Yong Lee 002; Hyeonchan Lim; Joohwan Lee; Hongbom Yoo; Yojoung Kim; Sungho Kang 001 (ATS, 2015)

Software-based embedded core test using multi-polynomial for test data reduction. - Soyeon Kang; Inhyuk Choi; Hyeonchan Lim; Sungyoul Seo; Sungho Kang 001 (ISOCC, 2016)

Test data reduction method based on berlekamp-massey algorithm. - Hyeonchan Lim; Junghwan Kim; Soyeon Kang; Sungho Kang 001 (ISOCC, 2017)

Broadcast scan compression based on deterministic pattern generation algorithm. - Hyeonchan Lim; Sungyoul Seo; Soyeon Kang; Sungho Kang 001 (ISQED, 2017)

Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. - Sungyoul Seo; Hyeonchan Lim; Soyeon Kang; Sungho Kang 001 (ISQED, 2017)

Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs. - Young-Woo Lee; Hyeonchan Lim; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. - Hyeonchan Lim; Seokjun Jang; Sungho Kang 001 (ISOCC, 2018)

Diagnosis of Scan Chain Faults Based-on Machine-Learning. - Hyeonchan Lim; Tae Hyun Kim; Seunghwan Kim; Sungho Kang 001 (ISOCC, 2020)

Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks. - Young-Woo Lee; Hyeonchan Lim; Youngkwang Lee; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs. - Jungil Mok; Hyeonchan Lim; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Logic Diagnosis Based on Deep Learning for Multiple Faults. - Tae Hyun Kim; Hyeonchan Lim; Minho Cheong; Hyojoon Yun; Sungho Kang 001 (ISOCC, 2022)

Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset. - Hyeonchan Lim; Hyojoon Yun; Juyong Lee; Sungho Kang 001 (ISOCC, 2022)

A Hybrid Test Scheme for Automotive IC in Multisite Testing. - Hyeonchan Lim; Hyojoon Yun; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis. - Hyeonchan Lim; Hyojoon Yun; Sungho Kang 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2022)

An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data. - Hyojoon Yun; Hyeonchan Lim; Hayoung Lee; Doohyun Yoon; Sungho Kang 001 (IEEE Access, 2024)

Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. - Hyeonchan Lim; Tae-Hyun Kim; Sungho Kang 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2024)