Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience. - Hyeong Kon Bae; Myung Jae Chung; Young-Ho Gong; Sung Woo Chung (DATE, 2023)

ZEC ECC: A Zero-Byte Eliminating Compression-Based ECC Scheme for DRAM Reliability. - Ji Hun Kwon; Hyeong Kon Bae; Young Seo Lee; Young-Ho Gong; Sung Woo Chung (IEEE Access, 2024)