DRAM Fault Classification through Large-Scale Field Monitoring for Robust Memory RAS Management. - Hoiju Chung; Euisang Oh; Seungmin Baek; Hyeongshin Yoon; Jaesung Yoo; Sanghwan Lee; Yongjun Lee; Arhatha Bramhanand; Brett Dodds; Yang Zhou 050; Nam Sung Kim (MICRO, 2025)