Predicting Patent Transfer in the Manufacturing Industry: A Machine Learning Model for Patent Analytics Using BERT. - Hyeonmin Park; Jeongho Kim; Eunbi Cho; Joo Hee Oh (IEEE Big Data, 2023)

A Stochastic RMS Jitter Monitoring Circuit for Clock Generators using Central Limit Theorem. - Hyeonmin Park; Ahryung Kim; Jeyeon Lee; SeongHwan Cho (APCCAS, 2024)

Machine Learning-Based System for Heat-Resistant Analysis of Car Lamp Design. - Hyebong Choi; Joel Shin; Jeongho Kim; Samuel Yoon; Hyeonmin Park; Hyejin Cho; Jiyoung Jung (IEICE Trans. Inf. Syst., 2024)