A New Analog-to-Digital Converter BIST Considering a Transient Zone. - Incheol Kim; Kicheol Kim; Youbean Kim; HyeonUk Son; Sungho Kang 001 (IEICE Trans. Electron., 2007)

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. - Kicheol Kim; Youbean Kim; Incheol Kim; HyeonUk Son; Sungho Kang 001 (IEICE Trans. Electron., 2008)

Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach. - HyeonUk Son; Incheol Kim; Sang-Goog Lee; Jin-Ho Ahn; Jeong-Do Kim; Sungho Kang 001 (IEICE Trans. Electron., 2011)

Reduced-code test method using sub-histograms for pipelined ADCs. - HyeonUk Son; Jaewon Jang; Heetae Kim; Sungho Kang 001 (IEICE Electron. Express, 2015)