Soft Error Issues with Scaling Technologies. - Sanghyeon Baeg; Jongsun Bae; Soonyoung Lee; Chul Seung Lim; Sang Hoon Jeon; Hyeonwoo Nam (Asian Test Symposium, 2012)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)