Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation. - Akinobu Teramoto; Keiichi Hashimoto; Tomoyuki Suwa; Jun-ichi Tsuchimoto; Marie Hayashi; Hyeonwoo Park; Shigetoshi Sugawa (IRPS, 2018)

On the Reliability of High-Performance Dual Gate (DG) W-Doped In2O3 FET. - Khandker Akif Aabrar; Hyeonwoo Park; Sharadindu Gopal Kirtania; Eknath Sarkar; Md Abdullah Al Mamun; Sunbin Deng; Chengyang Zhang; Gilbert B. Rayner; Kyeongjae Cho; Suman Datta (VLSI Technology and Circuits, 2024)

Improving LLM-Based Verilog Code Generation with Data Augmentation and RL. - Kyungjun Min; Seonghyeon Park; Hyeonwoo Park; Jinoh Cho; Seokhyeong Kang (DATE, 2025)

Monolithic 3D Stackable DRAM Design with BEOL-Compatible Oxide Channel Access Transistor. - Po-Kai Hsu; Sungwon Cho; Janak Sharda; Hyeonwoo Park; Suman Datta; Shimeng Yu (IMW, 2025)