Improvement of Retention Characteristics Using Doped SiN Layer Between WL Spaces in 3D NAND Flash. - Hyewon Kyung; Yunejae Suh; Youngho Jung; Daewoong Kang (IEEE Access, 2024)

A Novel Structure Between WL Spaces to Improve the Retention Characteristics in 3D NAND Flash. - Yunejae Suh; Hyewon Kyung; Youngho Jung; Daewoong Kang (IEEE Access, 2024)