Logic Diagnosis Based on Deep Learning for Multiple Faults. - Tae Hyun Kim; Hyeonchan Lim; Minho Cheong; Hyojoon Yun; Sungho Kang 001 (ISOCC, 2022)

Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset. - Hyeonchan Lim; Hyojoon Yun; Juyong Lee; Sungho Kang 001 (ISOCC, 2022)

A Hybrid Test Scheme for Automotive IC in Multisite Testing. - Hyeonchan Lim; Hyojoon Yun; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis. - Hyeonchan Lim; Hyojoon Yun; Sungho Kang 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2022)

Machine Learning based Scan Chain Diagnosis for Double Faults. - Hyojoon Yun; Tae-Hyun Kim; Sungho Kang 001 (ISOCC, 2023)

An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data. - Hyojoon Yun; Hyeonchan Lim; Hayoung Lee; Doohyun Yoon; Sungho Kang 001 (IEEE Access, 2024)