A Hybrid Model for Worm Simulations in a Large Network. - Eul-Gyu Im; Jung Sik Kim; In Woo Noh; Hyun Jun Jang (PAISI, 2007)

Data Protection in Memory Using Byte Reordering. - Hyun Jun Jang; Dae Won Hwang; Eul-Gyu Im (ISI Workshops, 2008)

A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors. - Hyun Jun Jang; Seung Min Lee; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2013)

Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors. - Seung Min Lee; Hyun Jun Jang; Jong Tae Park 003 (Microelectron. Reliab., 2013)

Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. - Hyun Jun Jang; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2016)