An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks. - Hyunbean Yi; Sungju Park; Misook Kim; Kiman Jeon (Human.Society@Internet 2003, 2003)

Hybrid test data compression technique for SOC scan testing. - Sangwook Cho; Jaehoon Song; Hyunbean Yi; Sungju Park (SoCC, 2005)

Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. - Hyunbean Yi; Jaehoon Song; Sungju Park (ITC, 2006)

Efficient Interconnect Test Patterns for Crosstalk and Static Faults. - Pyoungwoo Min; Hyunbean Yi; Jaehoon Song; Sanghyeon Baeg; Sungju Park (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. - Jaehoon Song; Hyunbean Yi; Juhee Han; Sungju Park (Asia-Pacific Computer Systems Architecture Conference, 2007)

Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. - Jaehoon Song; Juhee Han; Dooyoung Kim; Hyunbean Yi; Sungju Park (ATS, 2007)

Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. - Jaehoon Song; Piljae Min; Hyunbean Yi; Sungju Park (VTS, 2007)

A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. - Hyunbean Yi; Sungju Park; Sandip Kundu (ATS, 2008)

Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing. - Hyunbean Yi; Sandip Kundu (DFT, 2008)

Low-Cost Scan Test for IEEE-1500-Based SoC. - Hyunbean Yi; Jaehoon Song; Sungju Park (IEEE Trans. Instrum. Meas., 2008)

Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. - Jaehoon Song; Juhee Han; Hyunbean Yi; Taejin Jung; Sungju Park (IEEE Trans. Circuits Syst. II Express Briefs, 2009)

An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. - Jaehoon Song; Hyunbean Yi; Juhee Han; Sungju Park (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

Aging test strategy and adaptive test scheduling for SoC failure prediction. - Hyunbean Yi; Tomokazu Yoneda; Michiko Inoue; Yasuo Sato; Seiji Kajihara; Hideo Fujiwara (IOLTS, 2010)

A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. - Hyunbean Yi; Sandip Kundu; Sangwook Cho; Sungju Park (IEEE Trans. Circuits Syst. II Express Briefs, 2010)

On-Chip Support for NoC-Based SoC Debugging. - Hyunbean Yi; Sungju Park; Sandip Kundu (IEEE Trans. Circuits Syst. I Regul. Pap., 2010)

A Failure Prediction Strategy for Transistor Aging. - Hyunbean Yi; Tomokazu Yoneda; Michiko Inoue; Yasuo Sato; Seiji Kajihara; Hideo Fujiwara (IEEE Trans. Very Large Scale Integr. Syst., 2012)

Efficient diagnosis technique for aging defects on automotive semiconductor chips. - Jihun Jung; Muhammad Adil Ansari; Dooyoung Kim; Hyunbean Yi; Sungju Park (ETS, 2015)

On Diagnosing the Aging Level of Automotive Semiconductor Devices. - Jihun Jung; Muhammad Adil Ansari; Dooyoung Kim; Hyunbean Yi; Sungju Park (IEEE Trans. Circuits Syst. II Express Briefs, 2017)

Sow Posture Analysis and Estrus Prediction Using Closed-Circuit Television Cameras. - Sookeun Song; Taegeun Kang; Kyungtae Lim; Konmin Kim; Hyunbean Yi (IEEE Access, 2024)