Secure Scan Design through Pseudo Fault Injection. - Seokjun Jang; Hyungil Woo; Sunghoon Kim; Sungho Kang 001 (ISOCC, 2021)

A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. - Hyungil Woo; Seokjun Jang; Sungho Kang 001 (IEEE Access, 2021)