Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide. - Jongwoo Kim; Hyungjun Jo; Yonggyu Cho; Hyunyoung Shim; Jaesung Sim; Hyungcheol Shin (IEICE Electron. Express, 2022)

A Novel Read Scheme Using GIDL Current to Suppress Read Disturbance in 3-D nand Flash Memories. - Hyungjun Jo; Jongwoo Kim; Hyungcheol Shin (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)