Numerical Estimation of Yield in Sub-100-nm SRAM Design Using Monte Carlo Simulation. - Hyunwoo Nho; Sei-Seung Yoon; S. Simon Wong; Seong-Ook Jung (IEEE Trans. Circuits Syst. II Express Briefs, 2008)

A 32nm High-k metal gate SRAM with adaptive dynamic stability enhancement for low-voltage operation. - Hyunwoo Nho; Pramod Kolar; Fatih Hamzaoglu; Yih Wang; Eric Karl; Yong-Gee Ng; Uddalak Bhattacharya; Kevin Zhang 001 (ISSCC, 2010)