A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. - Youbean Kim; Kicheol Kim; Incheol Kim; Hyunwook Son; Sungho Kang (IEICE Trans. Inf. Syst., 2008)

Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. - Youbean Kim; Jaewon Jang; Hyunwook Son; Sungho Kang (IEICE Trans. Inf. Syst., 2010)