Novel integration technologies for improving reliability in NAND flash memory. - Hyunyoung Shim; Myoungkwan Cho; Kunok Ahn; Gihyun Bae; Sungwook Park (ISCAS, 2012)

Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide. - Jongwoo Kim; Hyungjun Jo; Yonggyu Cho; Hyunyoung Shim; Jaesung Sim; Hyungcheol Shin (IEICE Electron. Express, 2022)