Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations. - Hyejeong Hong; Jaeil Lim; Hyunyul Lim; Sungho Kang 001 (IEICE Electron. Express, 2013)

Dynamic thermal management for 3D multicore processors under process variations. - Hyejeong Hong; Jaeil Lim; Hyunyul Lim; Sungho Kang 001 (IEICE Electron. Express, 2013)

Low power scan bypass technique with test data reduction. - Hyunyul Lim; Wooheon Kang; Sungyoul Seo; Yong Lee 002; Sungho Kang 001 (ISQED, 2015)

Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. - Hyejeong Hong; Jaeil Lim; Hyunyul Lim; Sungho Kang 001 (ACM Comput. Surv., 2015)

3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability. - Jaeil Lim; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. - Wooheon Kang; Changwook Lee; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Reliab., 2015)

P-backtracking: A new scan chain diagnosis method with probability. - Tae Hyun Kim; Hyunyul Lim; Sungho Kang 001 (ISOCC, 2016)

A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. - Wooheon Kang; Changwook Lee; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Optimized Built-In Self-Repair for Multiple Memories. - Wooheon Kang; Changwook Lee; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2016)

LARECD: Low area overhead and reliable error correction DMR architecture. - Hyunyul Lim; Tae Hyun Kim; Dongsu Lee; Sungho Kang 001 (ISOCC, 2017)

FRESH: A New Test Result Extraction Scheme for Fast TSV Tests. - Jaeseok Park; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. - Dongsu Lee; Hyunyul Lim; Tae Hyun Kim; Sungho Kang 001 (TENCON, 2018)

A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. - Minho Cheng; Hyunyul Lim; Tae Hyun Kim; Sungho Kang 001 (ISOCC, 2019)

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. - Hyunyul Lim; Minho Cheong; Sungho Kang 001 (Sensors, 2020)