Wavelet-based envelope features with automatic EOG artifact removal: Application to single-trial EEG data. - Wei-Yen Hsu; Chao-Hung Lin; Hsien-Jen Hsu; Po-Hsun Chen; I-Ru Chen (Expert Syst. Appl., 2012)

Relays do not leak: CMOS does. - Hossein Fariborzi; Fred Chen; Rhesa Nathanael; I-Ru Chen; Louis Hutin; Rinus Lee; Tsu-Jae King Liu; Vladimir Stojanovic (DAC, 2013)

Macro-aware row-style power delivery network design for better routability. - Jai-Ming Lin; Jhih-Sheng Syu; I-Ru Chen (ICCAD, 2018)

Design-For-Reliability Flow in 7nm Products with Data Center and Automotive Applications. - Jae-Gyung Ahn; I-Ru Chen; Ping-Chin Yeh; Jonathan Chang (IRPS, 2019)

CCECE 2021 Invited Paper: Holistic Performance, Reliability and Thermal Understanding of HPC Real Utilization on Silicon Architecture. - Gamal Refai-Ahmed; Hoa Do; I-Ru Chen; Jae-Gyung Ahn; Huayan Wang; Xin Wu; Suresh Ramalingam (CCECE, 2021)

Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model. - Jae-Gyung Ahn; Rhesa Nathanael; I-Ru Chen; Ping-Chin Yeh; Jonathan Chang (IRPS, 2021)

A Fast Power Network Optimization Algorithm for Improving Dynamic IR-drop. - Jai-Ming Lin; Yang-Tai Kung; Zheng-Yu Huang; I-Ru Chen (ISPD, 2021)