On Probabilistic Testing of Large-Scale Sequential Circuits Using Circuit Decomposition. - Sunil R. Das; Wen-Ben Jone; Amiya Nayak; Ian Choi (VLSI Design, 1994)

On testing of sequential machines using circuit decomposition and stochastic modeling. - Sunil R. Das; Wen-Ben Jone; Amiya R. Nayak; Ian Choi (IEEE Trans. Syst. Man Cybern., 1995)