Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. - Ian M. Bell; Kevin R. Eckersall; Stephen J. Spinks; Gaynor E. Taylor (ISCAS, 1995)

Concurrent Self Test of Switched Current Circuits Based on the S2I-Technique. - Geir E. Sæther; Chris Toumazou; Gaynor E. Taylor; Kevin R. Eckersall; Ian M. Bell (ISCAS, 1995)

Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits. - José Machado da Silva; José Silva Matos; Ian M. Bell; Gaynor E. Taylor (J. Electron. Test., 1996)

Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. - Stephen J. Spinks; Chris D. Chalk; Ian M. Bell; Mark Zwolinski (DFT, 1997)

An On-Line Self-Testing Switched-Current Integrator. - Osama K. Abu-Shahla; Ian M. Bell (ITC, 1997)

Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. - S. Yu; Barrie W. Jervis; Kevin R. Eckersall; Ian M. Bell (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997)

Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits. - Ian M. Bell; Stephen J. Spinks (ICECS, 1998)

Design, Manufacture and Test - Quality Test Estimation. - J. M. Gilbert; Ian M. Bell; D. R. Johnson (ISQED, 2002)

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. - Stephen J. Spinks; Chris D. Chalk; Ian M. Bell; Mark Zwolinski (J. Electron. Test., 2004)

Scalable and Partitionable Asynchronous Arbiter for Micro-threaded Chip Multiprocessors. - Nabil Hasasneh; Ian M. Bell; Chris R. Jesshope (ARCS, 2006)

Supporting Microthread Scheduling and Synchronisation in CMPs. - Ian M. Bell; Nabil Hasasneh; Chris R. Jesshope (Int. J. Parallel Program., 2006)

High Level Modelling and Design For a Microthreaded Scheduler to Support Microgrids. - Nabil Hasasneh; Ian M. Bell; Chris R. Jesshope (AICCSA, 2007)

The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. - J. M. Gilbert; Ian M. Bell (J. Electron. Test., 2007)

Asynchronous arbiter for micro-threaded chip multiprocessors. - Nabil Hasasneh; Ian M. Bell; Chris R. Jesshope (J. Syst. Archit., 2007)

A novel approach for automated model generation. - Likun Xia; Ian M. Bell; Antony J. Wilkinson (ISCAS, 2008)

Automated Model Generation Algorithm for High-Level Fault Modeling. - Likun Xia; Ian M. Bell; Antony J. Wilkinson (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. - Thomas O. Myers; Ian M. Bell (J. Electron. Test., 2011)

Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling. - Likun Xia; Muhammad Umer Farooq; Ian M. Bell; Fawnizu Azmadi Hussin; Aamir Saeed Malik (J. Electron. Test., 2013)