Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. - Iboun Taimiya Sylla; Mustapha Slamani; Bozena Kaminska; Fartoumi M. Hossein; Patrick Vincent (VTS, 1998)

A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. - Iboun Taimiya Sylla; Mustapha Slamani; Bozena Kaminska (J. Electron. Test., 2001)

Building An RF Source For Low Cost Testers Using An ADPLL Controlled By Texas Instruments Digital Signal Processor (DSP) TMS320C5402. - Iboun Taimiya Sylla (ITC, 2003)

A new BIST scheme for 5GHz low noise amplifiers. - Jee-Youl Ryu; Bruce C. Kim; Iboun Taimiya Sylla (ETS, 2004)

A Novel RF Test Scheme Based on a DFT Method. - Jee-Youl Ryu; Bruce C. Kim; Iboun Taimiya Sylla (J. Electron. Test., 2006)

A new low-cost RF built-in self-test measurement for system-on-chip transceivers. - Jee-Youl Ryu; Bruce C. Kim; Iboun Taimiya Sylla (IEEE Trans. Instrum. Meas., 2006)