Measure twice and cut once: Robust dynamic voltage scaling for FPGAs. - Ibrahim Ahmed 001; Shuze Zhao; Olivier Trescases; Vaughn Betz (FPL, 2016)

Reconfigurable fault tolerant routing for networks-on-chip with logical hierarchy. - Gert Schley; Ibrahim Ahmed 001; Muhammad Afzal; Martin Radetzki (Comput. Electr. Eng., 2016)

Find the real speed limit: FPGA CAD for chip-specific application delay measurement. - Ibrahim Ahmed 001; Shuze Zhao; Olivier Trescases; Vaughn Betz (FPL, 2017)

Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs. - Ibrahim Ahmed 001; Shuze Zhao; James Meijers; Olivier Trescases; Vaughn Betz (FPL, 2018)

Automatic Application-Specific Calibration to Enable Dynamic Voltage Scaling in FPGAs. - Ibrahim Ahmed 001; Shuze Zhao; Olivier Trescases; Vaughn Betz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Frequency-Domain Power Delivery Network Self-Characterization in FPGAs for Improved System Reliability. - Shuze Zhao; Ibrahim Ahmed 001; Vaughn Betz; Ashraf Lotfi; Olivier Trescases (IEEE Trans. Ind. Electron., 2018)

Fast Voltage Transients on FPGAs: Impact and Mitigation Strategies. - Linda L. Shen; Ibrahim Ahmed 001; Vaughn Betz (FCCM, 2019)

Becoming More Tolerant: Designing FPGAs for Variable Supply Voltage. - Ibrahim Ahmed 001; Linda L. Shen; Vaughn Betz (FPL, 2019)

FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications. - Ibrahim Ahmed 001; Shuze Zhao; James Meijers; Olivier Trescases; Vaughn Betz (ACM Trans. Reconfigurable Technol. Syst., 2019)

Optimizing FPGA Logic Circuitry for Variable Voltage Supplies. - Ibrahim Ahmed 001; Linda L. Shen; Vaughn Betz (IEEE Trans. Very Large Scale Integr. Syst., 2020)