Outlier detection for single particle analysis in Electron Microscopy. - Carlos Oscar Sánchez Sorzano; Javier Vargas 001; José Miguel de la Rosa-Trevín; Airen Zaldívar-Peraza; Joaquín Otón; Vahid Abrishami; Ignacio Foche; Roberto Marabini; Gabriel Caffarena; José María Carazo (IWBBIO, 2014)