Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. - Ignasi Cortés; Jaume Roig; David Flores; Jesús Urresti; Salvador Hidalgo; José Rebollo (Microelectron. Reliab., 2005)

Lateral punch-through TVS devices for on-chip protection in low-voltage applications. - Jesús Urresti; Salvador Hidalgo; David Flores; Jaume Roig; Ignasi Cortés; José Rebollo (Microelectron. Reliab., 2005)

Superjunction LDMOS on thick-SOI technology for RF applications. - Ignasi Cortés; Pablo Fernández-Martínez; David Flores; Salvador Hidalgo; José Rebollo (Microelectron. J., 2008)

Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. - Ignasi Cortés; Pablo Fernández-Martínez; David Flores; Salvador Hidalgo; José Rebollo (Microelectron. Reliab., 2008)

Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions. - Xavier Perpiñà; Jean-François Serviere; Jesús Urresti-Ibañez; Ignasi Cortés; Xavier Jordà; Salvador Hidalgo; José Rebollo; Michel Mermet-Guyennet (IEEE Trans. Ind. Electron., 2011)

Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling. - Ignasi Cortés; Xavier Perpiñà; Jesús Urresti; Xavier Jordà; José Rebollo (Microelectron. Reliab., 2012)

Analysis and optimization of lateral thin-film Silicon-on-insulator (SOI) MOSFET transistors. - Ignasi Cortés; Gaëtan Toulon; Frederic Morancho; E. Hugonnard-Bruyere; B. Villard; W. J. Toren (Microelectron. Reliab., 2012)