Software system for semiconductor devices, monolith and hybrid ICs thermal analysis. - Konstantin O. Petrosjanc; Igor A. Kharitonov; N. I. Rybov; Peter P. Maltcev (EURO-DAC, 1995)

Multi-Level Testing Strategy for Radiation Hardened SOI/SOS ICs. - Konstantin O. Petrosjanc; Igor A. Kharitonov; Alexej S. Adonin (LATW, 2002)

TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies. - Konstantin O. Petrosyants; E. V. Orekhov; D. A. Popov; Igor A. Kharitonov; Lev M. Sambursky; A. P. Yatmanov; A. V. Voevodin; A. N. Mansurov (EWDTS, 2011)

Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems. - Konstantin O. Petrosyants; Igor A. Kharitonov (DSD, 2013)

New version of automated electro-thermal analysis in Mentor Graphics PCB Design System. - Konstantin O. Petrosyants; P. A. Kozynko; Igor A. Kharitonov; A. V. Sidorov; Y. N. Chichkanov (EWDTS, 2013)

Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU. - Konstantin O. Petrosyants; Igor A. Kharitonov; D. A. Popov (EWDTS, 2013)

Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel. - Konstantin O. Petrosyants; Igor A. Kharitonov; Lev M. Sambursky; V. N. Bogatyrev; Z. M. Povarnitcyna; E. S. Drozdenko (EWDTS, 2013)

Analysis and Simulation of temperature-current rise in modern PCB traces. - Konstantin O. Petrosyants; Artur Kortunov; Igor A. Kharitonov; Anton Popov; Natalya Gomanilova; Nikita I. Rjabov (EWDTS, 2014)

The system of microelectronics education for aerospace industry based on "university-enterprise" link. - A. N. Tikhonov; Boris G. Lvov; Konstantin O. Petrosyants; Saygid U. Uvaysov; Igor A. Kharitonov; S. V. Balakin; A. N. Chetyrkin; V. N. Krutikov (EWME, 2014)

Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model. - Konstantin O. Petrosyants; Lev M. Sambursky; Igor A. Kharitonov; Boris G. Lvov (LATS, 2016)

Electro-thermo-rad SPICE models for SOI/SOS MOSFETs. - Igor A. Kharitonov (EWDTS, 2017)

Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications. - Konstantin O. Petrosyants; Lev M. Sambursky; Igor A. Kharitonov; Mamed R. Ismail-Zade (EWDTS, 2017)

Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model. - Konstantin O. Petrosyants; Lev M. Sambursky; Igor A. Kharitonov; Boris G. Lvov (J. Electron. Test., 2017)

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C). - Konstantin O. Petrosyants; Igor A. Kharitonov; Sergey V. Lebedev; Lev M. Sambursky; Sergey O. Safonov; Veniamin G. Stakhin (Microelectron. Reliab., 2017)

SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits. - Konstantin O. Petrosyants; Igor A. Kharitonov (EWDTS, 2018)

SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C). - Konstantin O. Petrosyants; Lev M. Sambursky; Maxim V. Kozhukhov; Mamed R. Ismail-Zade; Igor A. Kharitonov; Bo Li 051 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)