The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. - Il-soo Lee; Yong Min Hur; Tony Ambler (Asian Test Symposium, 2004)

Two efficient methods to reduce power and testing time. - Il-soo Lee; Tony Ambler (ISLPED, 2005)

Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. - Il-soo Lee; Jae-Hoon Jeong; Anthony P. Ambler (ISVLSI, 2005)

Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. - Il-soo Lee; Yu-Ting Lin 004; Anthony P. Ambler (ISVLSI, 2005)

An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. - Geewhun Seok; Il-soo Lee; Tony Ambler; Baxter F. Womack (DFT, 2006)