An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. - Byung In Moon; Hongil Yoon; Ilgu Yun; Sungho Kang 001 (PDCAT, 2004)

Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers. - Bongyong Lee; Hongil Yoon; Kyung Sook Hyun; Yong Hwan Kwon; Ilgu Yun (Microelectron. J., 2004)

PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition. - Jung Hwan Lee; Young-Don Ko; Min-Chang Jeong; Jae-Min Myoung; Ilgu Yun (ISNN (2), 2006)

Modeling growth rate of HfO2 thin films grown by metal-organic molecular beam epitaxy. - Myoung-Seok Kim; Young-Don Ko; Tae-Houng Moon; Jae-Min Myoung; Ilgu Yun (Microelectron. J., 2006)

Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics. - Young-Don Ko; Moon-Ho Ham; Jae-Min Myoung; Ilgu Yun (Artificial Intelligence and Applications, 2007)

Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling. - Kyoung Eun Kweon; Jung Hwan Lee; Young-Don Ko; Min-Chang Jeong; Jae-Min Myoung; Ilgu Yun (Expert Syst. Appl., 2007)

Degradation analysis in asymmetric sampled grating distributed feedback laser diodes. - Han Sung Joo; Sang-Wan Ryu; Jeha Kim; Ilgu Yun (Microelectron. J., 2007)

Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates. - Jung Hwan Lee; Dong-Hun Kang; Young-Don Ko; Jaejin Jang; Dae-Shik Seo; Ilgu Yun (Expert Syst. Appl., 2008)

Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms. - Young-Don Ko; Pyung Moon; Chang Eun Kim; Moon-Ho Ham; Jae-Min Myoung; Ilgu Yun (Expert Syst. Appl., 2009)

Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests. - Keun Ho Rhew; Su Chang Jeon; Dae Hee Lee; Byueng-Su Yoo; Ilgu Yun (Microelectron. Reliab., 2009)

Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications. - Chang Eun Kim; Pyung Moon; Ilgu Yun; Sungyeon Kim; Jae-Min Myoung; Hyeon Woo Jang; Jungsik Bang (Expert Syst. Appl., 2011)

Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. - Edward Namkyu Cho; Jung Han Kang; Ilgu Yun (Microelectron. Reliab., 2011)

Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm. - Edward Namkyu Cho; Pyung Moon; Chang Eun Kim; Ilgu Yun (Expert Syst. Appl., 2012)

Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs. - Mingu Kang; Ilgu Yun (Microelectron. Reliab., 2012)

Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors. - Suehye Park; Edward Namkyu Cho; Ilgu Yun (Microelectron. Reliab., 2012)

Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. - Pyung Moon; Jun Yeong Lim; Tae-Un Youn; Keum-Whan Noh; Sung-Kye Park; Ilgu Yun (Microelectron. Reliab., 2013)

Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. - Jung Han Kang; Edward Namkyu Cho; Ilgu Yun (Microelectron. Reliab., 2014)

An analytical avalanche breakdown model for double gate MOSFET. - Edward Namkyu Cho; Yong-Hyeon Shin; Ilgu Yun (Microelectron. Reliab., 2015)

Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices. - Jun Yeong Lim; Ilgu Yun (Microelectron. Reliab., 2015)

Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. - Pyung Moon; Jun Yeong Lim; Tae-Un Youn; Keum-Whan Noh; Ilgu Yun (Microelectron. Reliab., 2015)

Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors. - Sang Myung Lee; Chuntaek Park; Ilgu Yun (Microelectron. Reliab., 2016)

Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display. - Dongseok Shin; Min Soo Bae; Ilgu Yun (Microelectron. Reliab., 2016)

Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens. - In Joong Kim; Ilgu Yun (IEEE Trans. Ind. Electron., 2016)

Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistor characteristics under dynamic mechanical stress. - Sang Myung Lee; Ilgu Yun (Microelectron. Reliab., 2017)

Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation. - Chuntaek Park; Ilgu Yun (Microelectron. Reliab., 2017)

Structure variation effects on device reliability of single photon avalanche diodes. - Dongseok Shin; Byungchoul Park; Youngcheol Chae; Ilgu Yun (Microelectron. Reliab., 2017)

Modeling and Simulation of Novel GaN-based Light Emitting Transistor for Display Applications. - Sang Myung Lee; Ilgu Yun (PRIME, 2018)

Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime. - Min Soo Bae; Chuntaek Park; Ilgu Yun (SMACD, 2018)

Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation. - Seungju Hwang; Ilgu Yun (ICEIC, 2022)