A Simple and Accurate Modeling Method of Channel Thermal Noise Using BSIM4 Noise Models. - Ilho Myeong; Juhyun Kim; Hyungwoo Ko; Ickhyun Song; Yongseok Kim; Hyungcheol Shin (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET. - Taeyoung Kim; Suhwan Lim; Ilho Myeong; Sanghyun Park; Suseong Noh; Seung Min Lee; Jongho Woo; Hanseung Ko; Youngji Noh; Moonkang Choi; Kiheun Lee; Sangwoo Han; et al. (IRPS, 2024)

A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND. - Ilho Myeong; Suhwan Lim; Taeyoung Kim; Sanghyun Park; Suseong Noh; Seung Min Lee; Jongho Woo; Hanseung Ko; Youngji Noh; Munkang Choi; Kiheun Lee; Sangwoo Han; et al. (IRPS, 2024)

In-depth Analysis of the Hafnia Ferroelectrics as a Key Enabler for Low Voltage & QLC 3D VNAND Beyond 1K Layers: Experimental Demonstration and Modeling. - Giuk Kim; Hyojun Choi; Hunbeom Shin; Sangho Lee; Sangmok Lee; Yunseok Nam; Minhyun Jung; Ilho Myeong; Kijoon Kim; Jongho Woo; Suhwan Lim; Kwangsoo Kim; et al. (VLSI Technology and Circuits, 2024)