A New Emitter Switched Thyristor (EST) employing Trench Segmented p-base. - In-Hwan Ji; Byung-Chul Jeon; Young-Hwan Choi; Yearn-Ik Choi; Min-Koo Han (Microelectron. J., 2006)

A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor. - In-Hwan Ji; Min-Woo Ha; Young-Hwan Choi; Seung-Chul Lee; Chong-Man Yun; Min-Koo Han (Microelectron. J., 2008)

SiC Power MOSFETs: Designing for Reliability in Wide-Bandgap Semiconductors. - Kevin Matocha; In-Hwan Ji; Xuning Zhang; Sauvik Chowdhury (IRPS, 2019)

High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. - In-Hwan Ji; Anoop Mathew; Jae-Hyung Park; Neal Oldham; Matthew McCain; Shadi Sabri; Edward Van Brunt; Brett Hull; Daniel J. Lichtenwalner; Donald A. Gajewski; John W. Palmour (IRPS, 2023)