A Prevenient Voltage Stress Test Method for High Density Memory. - Jongsoo Yim; Gunbae Kim; Incheol Nam; Sangki Son; Jonghyoung Lim; Hwacheol Lee; Sangseok Kang; Byungheon Kwak; Jinseok Lee; Sungho Kang (DELTA, 2008)

A Single-Ended Offset-Compensating Bit-Line Sense-Amplifier with Ground Precharge and Charge Transfer Pre sensing for Sub-1V DRAM. - Changyoung Lee; Youngseok Park; Hyunchul Yoon; Seryeong Yoon; Donggeon Kim; Bokyeon Won; Junhwa Song; In-Jae Bae; Jaejoon Song; Kyuchang Kang; Jaehyuk Kim; Kyungrak Cho; et al. (A-SSCC, 2024)

An Offset-Compensated Charge-Transfer Pre-Sensing Bit-Line Sense-Amplifier for Low-Voltage DRAM. - Kyeongtae Nam; Jaehyuk Kim; Dongil Lee; Kyuchang Kang; Sangyun Kim; Changyoung Lee; Hyunchul Yoon; Donggeon Kim; Bokyeon Won; Jaejoon Song; Incheol Nam; Young-Hun Seo; et al. (VLSI Technology and Circuits, 2024)

An Offset Compensated Charge Transfer Pre-Sensing Bitline Sense Amplifier. - Kyeongtae Nam; Dongil Lee; Kyuchang Kang; Sangyun Kim; Changyoung Lee; Hyunchul Yoon; Donggeon Kim; Bokyeon Won; Jaejoon Song; Jaehyuk Kim; Incheol Nam; Young-Hun Seo; et al. (IEEE J. Solid State Circuits, 2025)