Investigating PVT variability effects on full adders. - Stephanie O. Ames; Vínicius Zanandrea; Ingrid F. V. Oliveira; Samuel P. Toledo; Cristina Meinhardt (PATMOS, 2016)

Fault masking ratio analysis of majority voters topologies. - Ingrid F. V. Oliveira; Rafael B. Schvittz; Paulo F. Butzen (LATS, 2018)

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. de Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (LATS, 2021)

Fault Tolerance Evaluation of Different Majority Voter Designs. - Ingrid F. V. Oliveira; Matheus F. Pontes; Rafael B. Schvittz; Leomar S. da Rosa Jr.; Paulo F. Butzen; Rafael Iankowski Soares (ISCAS, 2022)

The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis. - Matheus F. Pontes; Ingrid F. V. Oliveira; Rafael B. Schvittz; Leomar Soares da Rosa Jr.; Paulo F. Butzen (ISCAS, 2022)

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Leomar S. da Rosa Jr.; Rafael Iankowski Soares; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (J. Electron. Test., 2023)