A novel entropy-based sensitivity analysis approach for complex systems. - Ingrid Kovacs; Alexandra Iosub; Marina Dana Topa; Andi Buzo; Georg Pelz (SSCI, 2016)

Integrated circuits' characterization for non-normal data in semiconductor quality analysis. - Ingrid Kovacs; Marina Dana Topa; Andi Buzo; Georg Pelz (ETS, 2017)

An accurate yield estimation approach for multivariate non-normal data in semiconductor quality analysis. - Ingrid Kovacs; Marina Dana Topa; Andi Buzo; Georg Pelz (SMACD, 2017)

A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits. - Ingrid Kovacs; Marina Dana Topa; Monica Ene; Andi Buzo; Georg Pelz (DCIS, 2020)

Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield Prediction. - Elena-Diana Sandru; Emilian David; Ingrid Kovacs; Andi Buzo; Corneliu Burileanu; Georg Pelz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Frontend-Backend Integrated Circuit Device Linking Using Machine Learning Algorithms. - Ingrid Kovacs; Bianca Carbunescu-Stoenescu; Marina Dana Topa; Andi Buzo; Emilian David; Georg Pelz (SMACD, 2024)