Path search engine for fast optimal path search using efficient hardware architecture. - Inhyuk Choi; Taewoo Han; Ilwoong Kim; Sungho Kang (ISOCC, 2011)

Bit transmission error correction scheme for FlexRay based automotive communication systems. - Inhyuk Choi; Taewoo Han; Sungho Kang (GCCE, 2013)

A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. - Taewoo Han; Inhyuk Choi; Hyunggoy Oh; Sungho Kang 001 (ATS, 2014)

A novel test access mechanism for parallel testing of multi-core system. - Taewoo Han; Inhyuk Choi; Sungho Kang (IEICE Electron. Express, 2014)

Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. - Taewoo Han; Inhyuk Choi; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. - Inhyuk Choi; Hyunggoy Oh; Sungho Kang 001 (APCCAS, 2016)

A new online test and debug methodology for automotive camera image processing system. - Hyunggoy Oh; Inhyuk Choi; Sungho Kang 001 (APCCAS, 2016)

Software-based embedded core test using multi-polynomial for test data reduction. - Soyeon Kang; Inhyuk Choi; Hyeonchan Lim; Sungyoul Seo; Sungho Kang 001 (ISOCC, 2016)

Process variation-aware bridge fault analysis. - Heetae Kim; Inhyuk Choi; Jaeil Lim; Hyunggoy Oh; Sungho Kang 001 (ISOCC, 2016)

A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. - Young-Woo Lee; Junghwan Kim; Inhyuk Choi; Sungho Kang (ISOCC, 2016)

Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. - Taewoo Han; Inhyuk Choi; Hyunggoy Oh; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Test item priority estimation for high parallel test efficiency under ATE debug time constraints. - Young-Woo Lee; Inhyuk Choi; Kang-Hoon Oh; James Jinsoo Ko; Sungho Kang (ITC-Asia, 2017)

DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. - Hyunggoy Oh; Inhyuk Choi; Sungho Kang 001 (IEEE Trans. Computers, 2017)

An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. - Hyunggoy Oh; Taewoo Han; Inhyuk Choi; Sungho Kang 001 (IEEE Trans. Computers, 2017)

Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. - Inhyuk Choi; Hyunggoy Oh; Young-Woo Lee; Sungho Kang 001 (IEEE Trans. Computers, 2018)

Analysis of Thermal Sensitivity by High Voltage Insulator Materials. - Taeyong Kim; Simpy Sanyal; Ja-Bin Koo; Ju-Am Son; Inhyuk Choi; Junsin Yi (IEEE Access, 2020)

Alohomora: protecting files from ransomware attacks using fine-grained I/O whitelisting. - Sanggu Lee; Yoona Kim; Dusol Lee; Inhyuk Choi; Jihong Kim 001 (HotStorage, 2022)

Integrated Host-SSD Mapping Table Management for Improving User Experience of Smartphones. - Yoona Kim; Inhyuk Choi; Juhyung Park; Jaeheon Lee; Sungjin Lee 001; Jihong Kim 001 (FAST, 2023)

P2Cache: An Application-Directed Page Cache for Improving Performance of Data-Intensive Applications. - Dusol Lee; Inhyuk Choi; Chanyoung Lee; Sungjin Lee 001; Jihong Kim 001 (HotStorage, 2023)

Straw: A Stress-Aware WL-Based Read Reclaim Technique for High-Density NAND Flash-Based SSDs. - Myoungjun Chun; Jae Yong Lee 004; Inhyuk Choi; Jisung Park 001; Myungsuk Kim; Jihong Kim 001 (IEEE Comput. Archit. Lett., 2025)