Structural Reliability and Performance Analysis of Backside PDN. - Sunghwan Kim; Geun-Myeong Kim; Seong-Nam Kim; Saetbyeol Ahn; Yoon-Suk Kim; Inkook Jang; Kyoung-Woo Lee; Dae Sin Kim (VLSI Technology and Circuits, 2023)

On the atomistic origin of the polymorphism and the dielectric physical properties of beryllium oxide. - Linda S. Reitz; Peter C. Müller 002; David Schnieders; Richard Dronskowski; Woon Ih Choi; Won-Joon Son; Inkook Jang; Dae Sin Kim (J. Comput. Chem., 2023)