BTI impact on SRAM sense amplifier. - Innocent Agbo; Seyab Khan; Said Hamdioui (IDT, 2013)

Bias Temperature Instability analysis of FinFET based SRAM cells. - Seyab Khan; Innocent Agbo; Said Hamdioui; Halil Kukner; Ben Kaczer; Praveen Raghavan; Francky Catthoor (DATE, 2014)

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Stefan Cosemans; Pieter Weckx; Praveen Raghavan; Francky Catthoor (DTIS, 2015)

BTI analysis of SRAM write driver. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (IDT, 2015)

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Halil Kukner; Pieter Weckx; Praveen Raghavan; Francky Catthoor (VTS, 2015)

Comparative BTI analysis for various sense amplifier designs. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Praveen Raghavan; Francky Catthoor (DDECS, 2016)

Read path degradation analysis in SRAM. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor; Wim Dehaene (ETS, 2016)

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Praveen Raghavan; Francky Catthoor; Wim Dehaene (ISVLSI, 2016)

Mitigation of sense amplifier degradation using input switching. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor; Wim Dehaene (DATE, 2017)

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. - Innocent Agbo; Mottaqiallah Taouil; Daniel Kraak; Said Hamdioui; Halil Kukner; Pieter Weckx; Praveen Raghavan; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. - Daniel Kraak; Mottaqiallah Taouil; Innocent Agbo; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Degradation analysis of high performance 14nm FinFET SRAM. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (DATE, 2018)

Impact and mitigation of SRAM read path aging. - Innocent Agbo; Mottaqiallah Taouil; Daniel Kraak; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor; Wim Dehaene (Microelectron. Reliab., 2018)

Methodology for Application-Dependent Degradation Analysis of Memory Timing. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (DATE, 2019)

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. - Daniel Kraak; Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (ETS, 2019)

Reliability Modeling and Mitigation for Embedded Memories. - Innocent Okwudili Agbo; Mottaqiallah Taouil; Said Hamdioui (ITC, 2019)

Software-Based Mitigation for Memory Address Decoder Aging. - Daniel H. P. Kraak; Cemil Cem Gürsoy; Innocent O. Agbo; Mottaqiallah Taouil; Maksim Jenihhin; Jaan Raik; Said Hamdioui (LATS, 2019)

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. - Daniel Kraak; Mottaqiallah Taouil; Innocent Agbo; Said Hamdioui; Pieter Weckx; Stefan Cosemans; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Big Data Architecture: Designing the Right Solution for Social Network Analysis. - Innocent Agbo; Alexander V. Kupriyanov; Igor Rytsarev (ISDFS, 2020)