Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism. - Insaf Lahbib; Aziz Doukkali; Patrick Martin; Philippe Descamps; Guy Imbert (IECON, 2017)

Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits. - André Lange; Fabio A. Velarde Gonzalez; Insaf Lahbib; Sonja Crocoll (ESSDERC, 2019)