Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. - Yeong-Chang Chou; D. Leung; Ioulia Smorchkova; Mike Wojtowicz; R. Grundbacher; L. Callejo; Q. Kan; R. Lai; P. H. Liu; D. Eng (Microelectron. Reliab., 2004)

A Cool, Sub-0.2 dB Noise Figure GaN HEMT Power Amplifier With 2-Watt Output Power. - Kevin W. Kobayashi; YaoChung Chen; Ioulia Smorchkova; Benjamin Heying; Wen-Ben Luo; William Sutton; Mike Wojtowicz; Aaron K. Oki (IEEE J. Solid State Circuits, 2009)